KETTERING UNIVERSITY PRESIDENT PRAISES ENTECH
ST. LOUIS, MO (October 21,2009) – Dr. Stanley R. Liberty, president of Kettering University, said about the work of Kettering alumni Gary J. Weil ’73 and Stephen Heinze ’08 of EnTech Engineering in St. Louis, “Our alumni are making the world a better place. Homeland security and water preservation objectives are crucial to our future.”
Dr. Liberty’s comments were made following review of the cover story, “Detecting Structural Defects” that is found in the 2009 Summer Issue of the University’s magazine, PERSPECTIVE.
The story chronicles Stephen Heinze’s career at EnTech, which according to the article is, “a professional engineering firm specializing in the use of remote sensing, non-destructive technologies to locate hidden subsurface targets and defects in energy, transportation, manufacturing, electronic and environmental infrastructures.”
Heinze has been able to use the firm’s proprietary “stacking” of non-destructive technologies such as infrared thermography, ground penetrating microwave radar, LIDAR, and magnetic flux to identify anomalies and provide engineering solutions. Two recent projects involved identifying underground tunnels, which has implications to Homeland Security, and locating leaks in the water supply of drought-stricken areas of the Southwest.